Analiza topografije površine primjenom mikroskopa atomskih sila

undergraduate thesis

• Title (english): Analysis of surface topography using an atomic force microscope
• Author: Fran Razumić
• Mentor: Biserka Runje (mentor)
• Mentor: Amalija Horvatić Novak (mentor)
• Granter: University of Zagreb; Faculty of Mechanical Engineering and Naval Architecture; Zagreb
• Defense date and country: 2020, Croatia
• Scientific / art field, discipline and subdiscipline: TECHNICAL SCIENCES; Mechanical Engineering; Precision Mechanical Engineering

Abstract

Mikroskop atomskih sila (engl. Atomic Force Microscope – AFM) pripada grupi mikroskopa s ticalima. AFM radi na principu raster skeniranja uzoraka. Skeniranje se provodi oštrim vrhom ticala koje, ovisno o odabranom načinu rada, dotiče ili prolazi veoma blizu površine predmeta koji se ispituje. Ispitivanje površine AFM-om ne traži posebnu pripremu uzorka koji se ispituje, a rezultat ispitivanja strukture površine do razine atoma dan je 3D prikazom. Mikroskopi atomskih sila pogodni su za ispitivanje površine materijala, atoma i molekula, individualnih makromolekula te bioloških podvrsta.

U prvom dijelu rada navedene su metode i uređaji koji se koriste za analizu topografije površine. U drugom dijelu rada pobliže je opisan AFM, prikazane su metode rada AFM-a i navedeni primjeri za svaku od metoda. Na posljetku, primjenom mikroskopa atomskih sila, napravljena analiza topografije površine odabranih uzoraka i etalona. Pri izradi ovog rada, za analizu i obradu topografija površina korišten je program Mountains SPIP (probna verzija).

Abstract (english)

The atomic force microscope (AFM) belongs to the group of microscopes with tentacles. AFM works on the principle of raster scanning of samples. Scanning is performed with a sharp tip of the probe which, depending on the selected mode, touches or passes very close to the surface of the object under test. Examination of the surface by AFM does not require special preparation of the sample, and the result of the examination of the surface structure up to the atomic level is given by 3D representation. Atomic force microscopes are suitable for examining the surface of materials, atoms and molecules, individual macromolecules and biological subspecies.

The first part of the dissertation the methods and devices used for surface topography analysis. The second part of the dissertation describes AFM in more detail, shows the methods of AFM operation and gives examples for each of the methods. Finally, using an atomic force microscope, an analysis of the surface topography of the selected samples and standards was made. During the preparation of this dissertation, the Mountains SPIP program (trial version) was used for the analysis and processing of surface topographies.

• Keywords: AFM; topografija; ticalo
• Keywords (english): AFM; topography; probe
• Language: croatian
• URN:NBN: urn:nbn:hr:235:925446
• Study programme: Title: Mechanical Engineering; Study programme type: university; Study level: undergraduate; Academic / professional title: sveučilišni/a prvostupnik/ prvostupnica (baccalaureus/baccalaurea) inženjer/inženjerka strojarstva (sveučilišni/a prvostupnik/ prvostupnica (baccalaureus/baccalaurea) inženjer/inženjerka strojarstva)
• Type of resource: Text
• File origin: Born digital
• Access conditions: Open access
• Created on: 2020-09-21 10:19:53